POLYMER CHARACTERIZATION
CHEM/CHE/MSE/TFE 6752
Course coordinators: Dr. Haskell Beckham
Prerequisites:
1 semester physical chemistry and
CHEM/CHE/ME/MSE/TFE 4775 or 4777 or equivalent, or consent of instructor
Proposed Catalog Description:
This course introduces the
student to surface, near-surface and structural methods of polymer
characterization. Specialized
techniques critical to physical structure are emphasized.
Course Justification:
The learning objectives for the course are:
1.
Learn essential concepts of techniques for structural
characterization of polymers
2.
Learn techniques for characterization of polymer surfaces
3.
Gain proficiency in use of characterization equipment
4.
Prepare students for research in the field of polymer
process-structure-property relationships
The course lecture materials have
been taught at Georgia Tech for 9 years. A drawback of the current course is
that there is no accompanying laboratory. The semester course corrects that
deficiency.
Text: No suitable text exists. A “notebook” has been
developed as instructor prepared handouts. This will be supplemented with
papers from literature.
Topical Outline
1. Introduction
2. Thermal Analysis
DSC/DTA; TGA; TMA; DMTA (DMS)
3. Diffraction and Scattering
Wide
Angle X-ray Diffraction (WAXD)
Small
Angle X-ray & Neutron Scattering (SAXS, SANS)
Small
Angle Light Scattering (SALS)
4. Fourier Transform IR (FTIR) & Raman Spectroscopy
5. Nuclear Magnetic Resonance (NMR)
Solution
& Solid State NMR
6. Electron Microscopy
SEM;
Electron Diffraction (SAED) and Imaging (TEM); Energy Dispersive Xray Analysis
(EDS/EDAX)
7. Surface Characterization of Solid Polymers:
X-ray
Photoelectric Spectroscopy (XPS/ESCA); Auger Electron Spectroscopy (AES);
Secondary Ion Mass Spectroscopy (SIMS)
8. Scanning Probe Microscopy Techniques:
STM,
AFM
9. Laboratories in:
i.
DSC/DTA/TGA
ii.
DMS
iii. WAXD:
Identification, Crystallinity, Crystal Size
iv.
WAXD: Orientation; SAXS
v.
WAXD, SAXS: photography/imaging techniques
vi.
FTIR: Identification, Phase Analysis
vii. Raman: Identification,
Phase Analysis
viii.FTIR/Raman:
Polarized Structural characterization
ix.
NMR: Solution state identification, stereochemistry
x.
NMR: Solid state identification, molecular mobility
xi.
SEM: topography
xii. STM/AFM: topography